Atomic photoexcitation as a tool for probing purity of twisted light modes
- authored by
- R. P. Schmidt, S. Ramakrishna, A. A. Peshkov, N. Huntemann, E. Peik, S. Fritzsche, A. Surzhykov
- Abstract
The twisted light modes used in modern atomic physics experiments can be contaminated by small admixtures of plane-wave radiation. Although these admixtures hardly reveal themselves in the beam-intensity profile, they may seriously affect the outcome of high-precision spectroscopy measurements. In the present study we propose a method for diagnosing such a plane-wave contamination which is based on the analysis of the magnetic sublevel population of atoms or ions interacting with the "twisted + plane-wave"radiation. In order to theoretically investigate the sublevel populations, we solve the Liouville-von Neumann equation for the time evolution of the atomic density matrix. The proposed method is illustrated for the electric dipole 5sS1/22-5pP3/22 transition in Rb induced by (linearly, radially, or azimuthally polarized) vortex light with just a small contamination. We find that even tiny admixtures of plane-wave radiation can lead to remarkable variations in the populations of the ground-state magnetic sublevels. This opens up new opportunities for diagnostics of twisted light in atomic spectroscopy experiments.
- External Organisation(s)
-
National Metrology Institute of Germany (PTB)
Technische Universität Braunschweig
Helmholtz Institute Jena
GSI Helmholtz Centre for Heavy Ion Research
Friedrich Schiller University Jena
Laboratory for Emerging Nanometrology Braunschweig (LENA)
- Type
- Article
- Journal
- Physical Review A
- Volume
- 109
- ISSN
- 2469-9926
- Publication date
- 04.03.2024
- Publication status
- Published
- Peer reviewed
- Yes
- ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
- Electronic version(s)
-
https://doi.org/10.1103/PhysRevA.109.033103 (Access:
Unknown)