Atomic photoexcitation as a tool for probing purity of twisted light modes
- verfasst von
- R. P. Schmidt, S. Ramakrishna, A. A. Peshkov, N. Huntemann, E. Peik, S. Fritzsche, A. Surzhykov
- Abstract
The twisted light modes used in modern atomic physics experiments can be contaminated by small admixtures of plane-wave radiation. Although these admixtures hardly reveal themselves in the beam-intensity profile, they may seriously affect the outcome of high-precision spectroscopy measurements. In the present study we propose a method for diagnosing such a plane-wave contamination which is based on the analysis of the magnetic sublevel population of atoms or ions interacting with the "twisted + plane-wave"radiation. In order to theoretically investigate the sublevel populations, we solve the Liouville-von Neumann equation for the time evolution of the atomic density matrix. The proposed method is illustrated for the electric dipole 5sS1/22-5pP3/22 transition in Rb induced by (linearly, radially, or azimuthally polarized) vortex light with just a small contamination. We find that even tiny admixtures of plane-wave radiation can lead to remarkable variations in the populations of the ground-state magnetic sublevels. This opens up new opportunities for diagnostics of twisted light in atomic spectroscopy experiments.
- Externe Organisation(en)
-
Physikalisch-Technische Bundesanstalt (PTB)
Technische Universität Braunschweig
Helmholtz-Institut Jena
GSI Helmholtzzentrum für Schwerionenforschung GmbH
Friedrich-Schiller-Universität Jena
Laboratory for Emerging Nanometrology Braunschweig (LENA)
- Typ
- Artikel
- Journal
- Physical Review A
- Band
- 109
- ISSN
- 2469-9926
- Publikationsdatum
- 04.03.2024
- Publikationsstatus
- Veröffentlicht
- Peer-reviewed
- Ja
- ASJC Scopus Sachgebiete
- Atom- und Molekularphysik sowie Optik
- Elektronische Version(en)
-
https://doi.org/10.1103/PhysRevA.109.033103 (Zugang:
Unbekannt)